Yannis Tsividis0195170148, 9780195170146
Table of contents :
TOC……Page 15
Ch 01 – Semiconductors, Junctions, and MOSFET Overview……Page 21
Ch 02 – The Two – Terminal MOS Structure……Page 70
Ch 03 – The Three – Terminal MOS Structure……Page 111
Ch 04 – The Four – Terminal MOS Structure……Page 145
Ch 05 – MOS Transistors with Ion – Implanted Channels……Page 227
Ch 06 – Small – Dimension Effects……Page 268
Ch 07 – The MOS Transisotr in Dynamic Operation – Large-Signal Modeling……Page 332
Ch 08 – Small – Signal Modeling for Low and Medium Frequencies……Page 379
Ch 09 – High – Frequency Small – Signal Models……Page 460
Ch 10 – MOSFET Modeling for Circuit Simulation……Page 533
App A – Energy Bands and Related Concepts……Page 576
App B – Basic Laws of Electrostatics in One Dimension……Page 585
App C – Charge Density, Electric Field, and Potential in the pn Junction……Page 591
App D – Energy Band Diagrams for the Two – Terminal MOS Structure……Page 593
App E – Charge Density, Electric Field, and Potential in the Two – Terminal MOS Structure……Page 597
App F – General Analysis of the Two – Terminal MOS Structure……Page 599
App G – Careful Definitions for the Limits of Moderate Inversion……Page 603
App H – Energy Band Diagrams for the Three – Terminal MOS Structure……Page 606
App I – General Analysis of the Three – Terminal MOS Structure……Page 610
App J – Drain Current Formulation using Quasi – Fermi Potentials……Page 613
App K – Results of a Detailed Formulation for the Drain Current ………Page 617
App L – Evaluation of the Intrinsic Transient Source and Drain Currents……Page 619
App M – Charges for the Accurate Strong – Inversion Model……Page 622
App N – Quantities used in the Derivation of the Non-Quasi-Static Y-Parameter Model……Page 625
Index……Page 628
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