Materials Science in Microelectronics I, Second Edition: The Relationships Between Thin Film Processing & Structure

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Edition: 2

Volume: volume 1

ISBN: 0-080-44640-X, 9780080446400

Size: 3 MB (3579110 bytes)

Pages: 270/275

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Eugene Machlin0-080-44640-X, 9780080446400

Thin films play a key role in the material science of microelectronics, and the subject matter of thin-films divides naturally into two headings: processing / structure relationship, and structure / properties relationship.The first volume of Materials Science in Microelectronics focuses on the first relationship – that between processing and the structure of the thin-film. The state of the thin film’s surface during the period that one monolayer exists – before being buried in the next layer – determines the ultimate structure of the thin film, and thus its properties. This volume takes into consideration the following potential influencing factors: crystal defects, void structure, grain structure, interface structure in epitaxial films, the structure of amorphous films, and reaction-induced structure.An ideal text or reference work for students and researchers in material science, who need to learn the basics of thin films.

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