52.Reliability

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Series: WILEY_ENCYCLOPEDIA_OF_ELECTRICAL_AND_ELECTRONICS_ENGINEERING

Volume: 52

Size: 4 MB (3990402 bytes)

Pages: 165/165

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John G. Webster (Editor)


Table of contents :
Local Disk……Page 0
51• Rehabilitation Engineering……Page 1
Abstract……Page 3
Bayesian Inference in Reliability……Page 4
Abstract……Page 12
Burn-In and Screening……Page 13
Abstract……Page 20
Design for Microelectronics Reliability……Page 22
Abstract……Page 45
Failure Modes and Effects Analysis……Page 46
Abstract……Page 51
Handbooks and Standards……Page 52
Abstract……Page 57
Life Testing……Page 58
Abstract……Page 69
Monte Carlo Simulation……Page 70
Abstract……Page 79
Probabilistic Risk Assessment……Page 80
Abstract……Page 88
Reliability Growth Concepts and Testing……Page 89
Abstract……Page 97
Reliability Indices……Page 98
Abstract……Page 102
Reliability of Redundant and Fault-Tolerant Systems……Page 103
Abstract……Page 110
Reliability Theory……Page 111
Abstract……Page 115
Reliability Via Designed Experiments……Page 117
Abstract……Page 133
Repairable Systems……Page 134
Abstract……Page 138
Statistical Analysis of Reliability Data……Page 139
Abstract……Page 152
Stress-Strength Relations……Page 153
Abstract……Page 157
Testing for Acceptance-Rejection……Page 158

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