Advances in Imaging and Electron Physics, Vol. 125

Peter W. Hawkes, Benjamin Kazan, Tom Mulvey (Eds.)978-0-12-014767-0

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

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Table of contents :
Content:
Contributors
Page ix

Preface
Pages xi-xii
Peter Hawkes

Future contributions
Pages xiii-xvi

An algebraic approach to subband signal processing Original Research Article
Pages 1-62
Marilena Barnabei, Laura B. Montefusco

Determining the locations of chemical species in ordered compounds: ALCHEMI Original Research Article
Pages 63-117,I
I.P. Jones

Aspects of mathematical morphology Original Research Article
Pages 119-194
K. Michelsen, H. De Raedt, J.Th.M. De Hosson

Ultrafast scanning tunneling microscopy Original Research Article
Pages 195-229
G.M. Steeves, M.R. Freeman

Low-density parity-check codes—A statistical physics perspective Original Research Article
Pages 231-353
Renato Vicente, David Saad, Yoshiyuki Kabashima

Computer-aided crystallographic analysis in the TEM Original Research Article
Pages 355-415,II-XII
Stefan Zaefferer

Index
Pages 417-426