Advances in Imaging and Electron Physics, Vol. 126

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Edition: 1st

ISBN: 978-0-12-014768-7

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Peter W. Hawkes (Ed.)978-0-12-014768-7

The four surveys contained in this volume illustrate widely diverse aspects of imaging and electron physics. The first two chapters address applications of electron microscopy, including the role of this technique in mineralogy and a study of the high- resolution electron microscopy of quasicrystals. The latter is actually a short monograph presenting the underlying crystallography and explaining in detail how the corresponding images and diffraction patterns should be interpreted. The third contribution is an account of a new approach to deconvolution in image processing in which the author, by associating a polynomial with the gray-level values of (discrete) images, shows that it is possible to invert the convolutional relation that describes many kinds of image formation. The volume ends with a detailed discussion of the dual de Broglie wave, including a critical account of new developments in the debate over the existence and role of such a wave.

Table of contents :
Content:
Contributors
Pages ix-x

Preface
Pages xi-xii
Peter W. Hawkes

Future contributions
Pages xiii-xvi

A wavelet-based method for multifractal image analysis: From theoretical concepts to experimental applications Original Research Article
Pages 1-92
A. Arnéodo, N. Decoster, P. Kestener, S.G. Roux

An analysis of the geometric distortions produced by median and related image processing filters Original Research Article
Pages 93-193
E.R. Davies

Two-photon excitation microscopy Original Research Article
Pages 195-286,I-XII
Alberto Diaspro, Giuseppe Chirico

Phase closure imaging Original Research Article
Pages 287-327
André Lannes

Three-dimensional image processing and optical scanning holography Original Research Article
Pages 329-350
Ting-Chung Poon

Nonlinear image processing using artificial neural networks Original Research Article
Pages 351-450
Dick De Ridder, Robert P.W. Duin, Michael Egmont-Petersen, Lucas J. Van Vliet, Piet W. Verbeek

Index
Pages 451-458

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