Random fluctuations and pattern growth: experiments and models

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Edition: 1

Series: NATO ASI series. Series E, Applied sciences 157

ISBN: 9780792300724, 0792300726, 0792300734

Size: 12 MB (13078720 bytes)

Pages: 366/366

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Harry Eugene Stanley, N. Ostrowsky9780792300724, 0792300726, 0792300734

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