Atomic Force Microscopy Scanning Tunneling Microscopy

Samuel H. Cohen, Marcia L. Lightbody9780306462979, 0-306-46297-4

This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies. The papers have been written by experts in probe microscopy from around the world, representing a wide range of disciplines, including physics, biotechnology, nanotechnology, chemistry, and materials science.