Yung-Li Lee, Jwo Pan, Richard Hathaway, Mark Barkey9780750677196, 0750677198
Fatigue Testing, Analysis, and Design: Theory and Applications
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Authors: Yung-Li Lee, Jwo Pan, Richard Hathaway, Mark Barkey
Edition: 1
ISBN: 9780750677196, 0750677198
Size: 7 MB (7120763 bytes)
Pages: 417/417
File format: pdf
Language: English
Publishing Year: 2004
Direct Download: Coming soon..
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