Machine Learning in Document Analysis and Recognition

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Authors: Raymond S.T. Lee, Vincenzo Loia (eds).

ISBN: 978-3-540-72376-9, 978-3-540-72686-9

Size: 5 MB (4728021 bytes)

Pages: 256/256

File format: pdf

Language: English

Publishing Year: 2008

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Category: Education

Raymond S.T. Lee, Vincenzo Loia (eds).978-3-540-72376-9, 978-3-540-72686-9

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