Physical Principles of Electron Microscopy An Introduction to TEM SEM and AEM

R. Egerton0-387-25800-0, 978-0387-25800-0

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

---

Table of contents :
Preliminaries……Page 1
Contents……Page 5
1 An Introduction to Microscopy……Page 10
2 Electron Optics……Page 36
3 The Transmission Electron Microscope……Page 66
4 TEM Specimens and Images……Page 102
5 The Scanning Electron Microscope……Page 134
6 Analytical Electron Microscopy……Page 164
7 Recent Developments……Page 186
Appendix Mathematical Derivations……Page 200
References……Page 204
Index……Page 206