Radiation effects and soft errors in integrated circuits and electronic devices

Daniel M. Fleetwood, R. D. Schrimpf9812389407, 9789812389404

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal–oxide–semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

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Table of contents :
Preface v……Page 6
Introduction to SOI MOSFETs: Context, Radiation Effects, and Future Trends 181……Page 8
Single Event Effects in Avionics and on the Ground 1……Page 10
Online and Realtime Dosimetry Using Optically Stimulated Luminescence 321……Page 9