Methods, Volume 1, Handbook of Microscopy: Applications in Materials Science, Solid-State Physics and Chemistry

S. Amelinckx, Dirk van Dyck, J. van Landuyt, Gustaaf van Tendeloo3527292802, 9783527292806, 3527294732, 9783527294732

Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information. With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: “How does a given technique work?”, and “Which techique is suitable for characterizing a given material?”

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Table of contents :
Cover Page……Page 1
Title: Handbook of Microscopy, Applications in Materials Science Solid-state Physics and Chemistry, Applications……Page 4
ISBN 3527292934……Page 5
Short biography of the editors……Page 6
List of Contributors……Page 8
1 Metals and Alloys……Page 15
2 Microscopy of Rocks and Minerals……Page 16
3 Semiconductors and Semiconducting Devices……Page 17
5 Domain Structures in Ferroic Materials……Page 18
6 Microscopy of Structural Ceramics……Page 19
8 Superconducting Ceramics……Page 20
9 Non-Periodic Structures……Page 21
11 Carbon……Page 22
12 Composite Structural Materials……Page 23
13 The Structure of Polymers and their Monomeric Analogs……Page 24
14 Nuclear Materials……Page 25
1 Small Particles……Page 27
3 Preparation Techniques for Transmission Electron Microscopy……Page 29
4 Environmental Problems……Page 30
General Reading, List of Symbols and Abbreviations, List of Techniques, Index……Page 31
General Introduction……Page 32
Part I Classes of Materials……Page 34
1.1 Imaging Metals Alloys: Introduction and……Page 36
1.2 Apparatus and Techniques for Imaging Metallic Systems……Page 39
1.3 Metallic Specimen Preparation for Transmission Electron Microscopy……Page 43
1.4. Typical Examples……Page 45
1.5 Imaging Metals and Alloys: Conclusions……Page 108
1.6 Imaging Phase Transformations in Metals and Alloys……Page 111
1.7 References……Page 135
2.2 Optical Microscopy, Petrology, and Other Optical Methods……Page 142
2.3 X-Ray Methods……Page 148
2.5 Cathodoluminescence Microscopy……Page 149
2.6 Scanning Electron Microscopy……Page 151
2.7 Transmission Electron Microscopy……Page 153
2.8 Electron Microscopy of Extraterrestrial Minerals and Rocks……Page 164
2.9 Electron Microscopy of Biogenic Minerals……Page 166
2.10 Auger Electron Spectroscopy (AES) and X-Ray Photoelectron Spectroscopy (XPS)……Page 167
2.12 The Scanning Proton Microprobe and MicroProton-Induced X-Ray Emission Spectroscopy……Page 168
2.13 Scanning Tunneling Microscopy and Atomic Force Microscopy……Page 170
2.14 References……Page 171
3.1 Introduction……Page 176
3.2 Semiconductor Bulk Material……Page 179
3.3 Silicon Technology Processes……Page 184
3.4 Silicon Device Structures……Page 211
3.5 Compound Semiconductor Devices……Page 221
3.6 References……Page 233
4.1 Introduction……Page 238
4.2 Materials for Optoelectronic Devices……Page 240
4.3 Microscopic Techniques……Page 243
4.4 Applications to Optoelectronic Materials……Page 248
4.5 Conclusion……Page 262
4.6 References……Page 263
5.2 Ferroelastic Phase Transitions……Page 266
5.3 Wall Energies and Wall Profiles……Page 272
5.5 Bending of Domain Walls and the Compatibility Relationship……Page 274
5.6 Wall-Wall Interactions in Ferroelastic Materials……Page 277
5.7 Tweed Microstructures as the Result of Kinetic Processes at……Page 278
5.8 Ferroelectric Domains……Page 281
5.9 References……Page 282
6.1 Introduction……Page 284
6.2 Different Imaging Techniques……Page 285
6.3 Essential Microstructural Aspects of Structural Ceramics……Page 287
6.4 Studies on Alumina……Page 288
6.6 Studies on Silicon Nitride (Si3N4)……Page 308
6.7 Studies on Composites……Page 313
6.8 References……Page 320
7.1 Optical Microscopy……Page 324
7.2 The Use of Electron Microscopic Techniques for the Characterization of Gemstones……Page 342
7.4 References……Page 351
8.1 Introduction……Page 352
8.2 Imaging Superconducting Ceramics……Page 353
8.3 Specific Problems in Superconductivity Research……Page 385
8.4 References……Page 408
9.1 High-Resolution Imaging of Amorphous Materials……Page 416
9.2 Quasicrystalline Structures……Page 430
10.1 Introduction……Page 442
10.2 Biocompatibility……Page 445
10.3 Applications of Microscopy to Evaluate Biocompatibility……Page 447
10.4 Imaging and Characterization of Tissue Components in the Body……Page 454
10.5 Applications of Microscopy for Characterization of Biomaterials……Page 457
10.7 References……Page 466
11.2 The Different Forms of Carbon……Page 468
11.3 Graphite……Page 471
11.4 Diamond……Page 477
11.5 Fullerenes……Page 482
11.6 Carbon Nanotubules and Nanoparticles……Page 488
11.7 Appendices……Page 503
11.8 References……Page 508
12.2 Sample Preparation……Page 514
12.3 Quantitative Microstructural Analysis……Page 518
12.4 Structure of the Constituent Phases……Page 525
12.5 Structure of Composites……Page 529
12.6 Damage Mechanisms……Page 531
12.7 Concluding Remarks……Page 535
12.8 References……Page 536
13.1 Introduction……Page 538
13.2 Structure-Property Relationships in the Polymer Classes Major……Page 540
13.3 The Use of New Microscopy Methods to Study Polymers……Page 580
13.4 Electron Crystallography……Page 589
13.5 High Resolution Transmission Electron Microscopy……Page 600
13.6 Summary……Page 605
13.7 References……Page 607
14.1 Introductory Remarks on Handling Nuclear Materials……Page 614
14.2 Structural Materials (Alloys)……Page 620
14.3 Nuclear Fuels……Page 675
14.4 Materials for Waste Disposal……Page 686
14.5 Electron Microscopy of Radioactive Aerosols and Particles and the Assessment of Toxicological Hazards……Page 689
14.6 References……Page 692
15.1 Introduction: Observables and Methods……Page 696
15.2 Magnetization Processes and Optical Microscopy……Page 698
15.3 Micromagnetics and High Resolution Electron Methods……Page 705
15.4 Information Storage Media and Mechanical Scanning Methods……Page 710
15.5 Further Problems and Methods……Page 713
15.6 References……Page 716
Part II Special Topics……Page 720
1.2 Characterization Methods……Page 722
1.3 Small-Particle Materials……Page 730
1.4 Required Characterizations……Page 739
1.5 Detailed Structure Imaging……Page 748
1.6 Beam-Induced Phenomena……Page 751
1.7 Typical Characterization Problems Related to Small Size……Page 756
1.8 Specimen Preparation Related Topics……Page 758
1.9 References……Page 764
2.2 Phase Transitions and Structural Phase Transformations……Page 770
2.3 Recent Advances……Page 771
2.4 In Situ Observations……Page 772
2.5 Investigations of Pretreated Samples……Page 777
2.6 Concluding Remarks……Page 780
2.7 References……Page 781
3.1 Indirect Investigation of Materials……Page 782
3.2 Direct Investigation of Materials……Page 788
3.3 Ion Beam Preparation……Page 800
3.4 References……Page 829
4.1 Introduction……Page 834
4.2 Scanning Microanalysis……Page 835
4.3 Scanning Transmission Electron Microscopy……Page 844
4.4 Electron Energy-Loss Spectrometry……Page 846
4.5 Micro-Raman Spectrometry……Page 847
4.7 References……Page 848
5.2 The Need for Quantification……Page 852
5.3 Instrument Calibration……Page 853
5.4 Sample Type……Page 854
5.5 Data Recording……Page 857
5.6 Ultimate Sensitivity and its Significance……Page 861
5.7 Case Studies……Page 862
5.8 References……Page 864
General Reading……Page 865
List of Symbols and Abbreviations……Page 870
List of Techniques……Page 881
A……Page 885
B……Page 886
C……Page 887
D……Page 889
E……Page 890
F……Page 891
H……Page 892
I……Page 893
M……Page 894
O……Page 896
P……Page 897
R……Page 899
S……Page 900
T……Page 902
V……Page 903
Z……Page 904