Advances in Imaging and Electron Physics, Vol. 145

Peter W. Hawkes (Ed.)978-0-12-373907-0

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

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Table of contents :
Content:
Contents
Pages v-vi

Contributors
Page vii

Preface
Page ix
Peter Hawkes

Future contributions
Pages xi-xv

Applications of Noncausal Gauss–Markov Random Field Models in Image and Video Processing Review Article
Pages 1-53
Amir Asif

Direct Electron Detectors for Electron Microscopy Review Article
Pages 55-93
A.R. Faruqi

Exploring Third-Order Chromatic Aberrations of Electron Lenses with Computer Algebra Review Article
Pages 95-148
Zhixiong Liu

Anisotropic Diffusion Partial Differential Equations for Multichannel Image Regularization: Framework and Applications Review Article
Pages 149-209
David Tschumperlé, Rachid Deriche

Index
Pages 211-220